Test system improves power semiconductor production throughput
The ETS-88TH provides an overall lower cost of test with the ability to combine AC and DC testing in a single device insertion.
The ETS-88TH features an AC-2500 option which offers the capability to test dynamic switching including waveform capture for AC parameters such as TDon/off, Trise/fall, Eon/off, Trr, Qrr, UIL, Qg.
The tester’s low inductance signal path provides the ability to test at higher power levels and faster switching speeds to increase device performance specification.
The ETS-88TH’s multi-sector technology increases throughput by delivering >99% test efficiency for parallel applications and reduces test time by 50% for index parallel applications.
The tester’s EagleVision MST Software allows faster time to market with powerful software tools for rapid device characterization and production development.
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