Test without a trace

Test without a trace

New Products |
By eeNews Europe

This guarantees the fast implementation of all individual customer requirements. The high level of vertical integration enables top quality with short lead times. The probe pins only touch the material at a tiny point and only apply enough pressure to make a secure connection, but the material will not be deformed. The vertical placement of the pins causes no scratches, furrows or grooves and the Device under Test (DuT) leaves the test socket almost without trace. More and more contacts in less and less space require the highest degree of precision. The test sockets are offered from a pitch of 0.3mm in the highest material and production quality. Housings are made of PEEK and anodised aluminum while the individually tested probe pins are made of a beryllium copper alloy coated with nickel and gold. Yamaichi Electronics guarantees up to 50,000 mating cycles for each FPC/FFC test socket.

Yamaichi Electronics –

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