Using discrete components for Ultrafast Electrical Pulse Generation Technology
Read and enjoy this straightforward electronic design process of Ultrafast Electrical Pulse technology
Ultrafast diagnostic techniques have been widely used in basic research, photobiology, photochemistry and defense. The need for process measurements at picosecond and femtosecond time scales has driven the development of ultrafast diagnostics. To meet this need, researchers in this field have focused on developing diagnostic techniques and devices with high temporal and spatial resolution, which has become an important direction for research in this field.
This research is done by the Key Laboratory of Ultrafast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences and the Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, China.
This paper is focussing on designing a new high-repetition frequency ultrafast electric pulse generation (UPG) circuit using pure electronics components, which consists of combining avalanche transistor model 2N2222 with a hybrid Marx structure at the same time in the pulse circuit to add filtering, fast recovery diodes and pulse cutoff and other matching techniques to make its output more stable, which can obtain higher output frequency, faster rise-time and narrower pulse widths. It has been tested that a high re-frequency ultrafast high-voltage electrical pulse signal with a pulse repetition frequency of 200 kHz, a leading edge of 800 ps, a half-high pulse width of 5 ns, an amplitude of 1.2 kV and jitter of less than 5% can be generated at the load with a 50 Ω load at the output. The signal can be applied in the fields of ultrafast diagnosis, information countermeasures and nuclear electromagnetic radiation research.
The design compasses a High Voltage Switchgear Module, an Avalanche Conduction Mechanism and a Pulse Generation Circuit
In the article you will find the theory behind it, the experiments and the test set-up with all the equipment … read all here
Source: www.mpdi.com
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