Web-based seminar; the curve tracer in testing power semiconductors
This event, which is available for on-demand viewing, will discuss the curve tracing challenges posed by today’s power semiconductor devices and will teach viewers how to perform both I-V and high voltage C-V measurements with a modern parametric curve tracer. To register for this event, visit www.keithley.com/ws/1388
"Testing Modern Power Semiconductor Devices Requires a Modern Curve Tracer" is recommended for engineers, physicists, and scientists involved in the designing, testing or manufacturing of power semiconductor devices and examines a variety of topics:
– The role of traditional curve tracers in testing power semiconductor devices
– The market drivers for modern power semiconductor devices
– How source measure unit (SMU) instruments can be configured to create a modern parametric curve tracer
– How to perform high voltage C-V measurements with a modern parametric curve tracer
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