C-V Measurement Tips, Tricks, and Traps

By Keithley Instruments
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Capacitance-voltage (C-V) testing has long been used to determine a variety of semiconductor parameters on many different devices and structures. Product and yield enhancement engineers use them in optimizing processes and device performance; reliability engineers employ them in qualifying material suppliers, monitoring process parameters, and analyzing failure mechanisms. This white paper offers an overview on selecting the most appropriate instrumentation for a particular application, as well as some of the C-V tests typically performed and their parameter extraction limits. Read More

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White Papers