XJTAG supports ARM single wire debug

XJTAG supports ARM single wire debug

New Products |
By Nick Flaherty

XJTAG 3.11 allows engineers using an ARM Cortex microcontroller to access the core via any two pins of the XJLink2 probe using the single wire debug (SWD) protocol. As well as being used to program a device’s internal memory, this interface also allows an SWD-device to be controlled directly during a board test-for example, to provide a way to test a peripheral such as an ADC; and to program connected memories.

Although XJTAG always recommends bringing out a processor’s JTAG signals for good test coverage, if this cannot be done for some reason, this release provides a way to test the device’s connections by using SWD to control its GPIO pins. Devices that multiplex SWD on their JTAG pins are supported by an additional function that automates switching between the two modes. 

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The latest release also introduces an application that allows engineers to create and manage their own library of XJEase device files and circuit code files. This library can also be distributed and maintained across an organisation to help drive consistency between teams, reduce the risk of duplicated effort, and minimise the time taken to maintain projects. When categorising devices or adding circuit code files to a project, this new library can be added to XJDeveloper’s list of libraries to be used.

Engineers looking for a way to prevent a watchdog timer from resetting the board during testing, or who need a simple clock input, can use the new oscillator output. This can remove the need for a separate signal generator ad is adjustable in 10 kHz steps from 10 kHz to 166 MHz and has a high-impedance output state when switched off. It is easy to control during a test using XJEase and runs without continuous software interaction, making it ideal when testing a board that requires a constant input. It is available on all XJLink2-based hardware, including USB, PXI and Quad versions.

To make creating projects easier, XJTAG has responded to several engineering requests by adding support for importing BOM files in Excel format (.xls and .xlsx), including multi-tab files.

It is also now easier to deal with multiple log files. Engineers no longer need to open every file to find the ones they want because the Log File Viewer in XJTAG 3.11 enables users to filter and search a collection of log files based on their content. This allows users to filter log files to identify those where a specific test failed, or those generated at a particular time or from a specific XJPack or project version. This speeds up the process of identifying trends and debugging problems. Other additions to the Log File Viewer include the ability to preview a list of tests and results before opening the file, easier navigation through the file because the relevant section is highlighted when a test is selected in the navigation pane, and the addition of a “most recently used” list of folders.

When debugging problems with dynamic JTAG chains, it’s now easier to switch profiles on XJDeveloper’s Analyser, Debug Connection Test, and Pin Mapping screens: instead of needing to change the project’s default setting, you can now switch freely between profiles.

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