Thanks to its modular design it allows contacting of standard low-signal-quality applications to high-performance embedded solutions. The first variant of this robust and easy-to-use test fixture has a base of approximately 566x463mm with a height of approximately 197mm. Thus, the available work surface, i.e. the maximum size of a DUT (single assembly or multiple applications) is limited to about 270x270mm. A total of up to 1020 connections are available, which can process up to 12.5Gbps signals in the standard version. The necessary impedance and signal runtime adjustment is ensured on the TAB (Test Application Board).
The main components of the test fixture consist of the basic box, the contact units and the extension box. The novel lever mechanism enables simple operation and horizontal or parallel contacting of the test sample, regardless of whether it has to be contacted only from one side or from the top and bottom in the sandwich method. By selecting the possible contact unit - either through a cassette or the Test Application Board (TAB) - the smallest possible test pitch is selected.
Yamaichi Electronics - www.yamaichi.eu