Inline tester for RAIN inlays and tags

October 23, 2019 //By Julien Happich
The CISC RAIN Xplorer Inline is a unit for the high-speed performance testing of RAIN inlays and tags during the production process.

The inline tester offers quality assurance during the production process from start to end and comes with a GUI that gives users a detailed overview of the performance metrics. The unit enables to spots anomalies during the production process in real-time, while offering users the flexibility to create their own performance matrix for better analysis. The instrument can test for performance on multiple frequencies on a single RAIN RFID inlay or tags at high speed to match the current market demand. It operates in the 800MHz to 1GHz range with a TX power range from 1 dBm to 28 dBm and a sensitivity of -80 dBm. The instrument can read EPC, TID and memory, it can also write to memory (encoding). It comes with a GPIO for external trigger and a USB port for communication.

CISC Semiconductor -

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