First King’s Award for Innovation in 2023 for SiC and GaN tester
Technology for testing SiC and GaN semiconductors at high switching speeds has won one of the first awards for innovation under King Charles III in the UK.
ipTEST won in the innovation category of the Kings Award for Enterprise, which naturally follows the Queen’s Award first presented in 1966, for the test capabilities available for high power SiC and GaN semiconductors. For the most accurate results, devices should be tested as close to their operating speed as possible. However, this is a challenge for SiC and GaN which are usually switched at much higher speeds than conventional silicon.
To solve this problem, ipTEST developed the DS5 test generator. The layout of DS5 was designed from the ground up to operate at the highest speeds and perform the fastest dynamic tests.
The result is that DS5 gives the clearest picture of SiC and GaN device performance at speed, allowing manufacturers to maximize the quality of their products. This is particularly important for electric vehicle applications where power devices are at the heart of the drivetrain.
“DS5 has been tremendously well received by our customers and I’m so proud it’s been recognised in the Innovation category of the King’s Award.” says Dr Conor McCarthy, Managing Director at ipTEST which is based in Guildford. “This has been a true team effort by everyone within our company.”
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